Thin film characterization of novel phthalimide materials

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dc.contributor.authorŞen, Sibel
dc.contributor.authorCapan, Rifat
dc.contributor.authorOzel, Mehmet Emin
dc.contributor.authorHassan, A. K.
dc.contributor.authorTurhan, O.
dc.contributor.authorNamli, H.
dc.date.accessioned12.07.201910:50:10
dc.date.accessioned2019-07-12T15:28:06Z
dc.date.available12.07.201910:50:10
dc.date.available2019-07-12T15:28:06Z
dc.date.issued2011
dc.departmentFen Edebiyat Fakültesien_US
dc.descriptionWOS: 000298850300025en_US
dc.description.abstractSpin coating technique is employed to produce thin phthalimide films using novel p-phthalimidobenzoic acid (FIBA) and N-(phthalimido)-p-aminobenzoic acid (FIABA) materials. Several spin speeds and various solution concentrations are chosen to monitor the thin film deposition process of these new materials. The optical properties are studied using UV-visible spectroscopy and spectroscopic ellipsometry methods. The absorption of the FIBA and FIABA films against the spin speed showed an exponential behavior. pi -> pi* transition is occurred. The thicknesses of thin films at 2000 rpm are obtained 15.86 nm for FIBA and 12.99 nm for FIABA using spectroscopic ellipsometry results.en_US
dc.description.sponsorshipOnsekiz Mart University Research Council Foundation [2005/111]en_US
dc.description.sponsorshipThis work was supported by Onsekiz Mart University Research Council Foundation under Project number 2005/111.en_US
dc.identifier.endpage1247en_US
dc.identifier.issn1842-6573
dc.identifier.issue11en_US
dc.identifier.scopus2-s2.0-83455181806
dc.identifier.scopusqualityQ4
dc.identifier.startpage1243en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12507/627
dc.identifier.volume5en_US
dc.identifier.wosWOS:000298850300025
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherNATL INST OPTOELECTRONICSen_US
dc.relation.ispartofOptoelectronıcs and advanced materıals-rapıd communıcatıons
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectPhthalimidesen_US
dc.subjectSpun Filmsen_US
dc.subjectUV-vis Spectroscopyen_US
dc.subjectSpectroscopic Ellipsometryen_US
dc.titleThin film characterization of novel phthalimide materials
dc.typeArticle

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